Stable references for how SVEND studies, data interfaces, and integrations work. A documentation page distinguishes what is available today from what is proposed, under validation, or deliberately outside the product boundary.
Declare parts and appraisers, issue a randomized run sheet with a recorded seed, capture readings off the instrument, and judge the completed study by ANOVA against a record whose readings are hash-chained.
Read the study reference →Declare factors in their real units, generate one of seven design families, carry a randomized run sheet to the line, and fit the effects against the design that produced them.
Read the design reference →Choose among I-MR, X-bar/R, X-bar/S, p, np, c, and u charts, then run documented manufacturing datasets through the Meganeura engine.
Choose a control chart →Upload CSV data, paste comma- or tab-separated tables, and export analysis results as CSV, Excel, or structured JSON.
Read the data reference →Open an .MTW worksheet on the bench, run the study, and take a worksheet back out, including a Gage R&R in the column shape the analysis expects on the other side.
Read the interchange reference →Capture numeric readings from USB and Bluetooth devices that behave as a keyboard, with Enter advancing the randomized Gage R&R run sheet.
Read the setup guide →What the SPC output on a Mitutoyo gage actually sends (thirteen nibbles carrying a value, a sign, a decimal position and a unit) and what its omissions mean for traceability and Gage R&R.
Read the protocol reference →Use the standard keyboard interface already accepted by SVEND with Sylvac instruments configured for Bluetooth HID operation.
Read the compatibility guide →Connect Mitutoyo U-WAVE-T, U-WAVE-TM, and U-WAVE-TC transmitters to SVEND through a MobileCollect EVO base. Covers the keyboard-wedge path available today and the proposed identified USB-serial collector.
Read the specification →The exposure window, the seven steps of an impact analysis, and the eleven things a records system must already hold for reverse traceability to be possible at all.
Read the recall reference →An interval is a bet on end-of-period reliability. Where the number on a register came from, what setting one properly requires, and why the data it needs is usually thrown away.
Read the interval reference →Why a register identifies instances and not models, marking that survives a shop floor, what a check-out record is metrologically worth, and the two crib failure modes almost nobody fixes.
Read the register reference →The real incumbent, assessed honestly: the two different jobs a spreadsheet is doing, where each one breaks, and why a value in the wrong row is worse than a typo no matter how it got there.
Read the assessment →What an advanced electronic signature proves and what it cannot, the four PAdES levels, why a self-reported signing time is not evidence of when, and why the standard names a person rather than a system.
Read the reference →One format instead of an integration per laboratory. What a DCC carries, why a unit written as text is not a unit, and the three questions a document format does not settle.
Read the format reference →Abbe error, cosine error, temperature and measuring force: four mechanisms that recur through every instrument class, and why resolution is not accuracy.
Read the shared physics →A 0.01 mm display on a ±0.02 mm instrument, a structurally Abbe-violating geometry, and the one holding instruction worth more than all the others combined.
Read the caliper reference →Why it beats a caliper by an order of magnitude for three structural reasons, and why a large frame must be zeroed in the orientation it will be used in.
Read the micrometer reference →Available means the behavior is present in the running product. Proposed means the design is public for review but is not a claim that the complete integration ships today. Under validation means hardware or reference testing is in progress.